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Fig. 2 | Microbial Cell Factories

Fig. 2

From: Augmented peroxisomal ROS buffering capacity renders oxidative and thermal stress cross-tolerance in yeast

Fig. 2

Cellular ROS level, MDA level, and cell damage of the parent and G14. a The relative ROS level of the parent and G14 grown at 30 °C for 16 h. The samples were collected at the logarithmic growth phase and treated with DCFH-DA at 30 °C (non-stress treatment condition) and 37 °C (stress treatment condition). Take the fluorescence intensity value of G14 treated at 30 °C as a reference. b ROS level of the parent and G14 during chronological aging at 37 °C. The fluorescence intensity value of G14 at 37 °C for 24 h was set as a reference. c Lipid peroxidation analysis of the parent and G14 by measuring MDA concentration under stress treatment condition. d The apoptosis and necrosis rate of cells under stress treatment condition. The early apoptotic cells were stained by Annexin V-FITC, while the necrotic cells were stained by Annexin V-FITC and PI simultaneously. Therefore, the percentage of apoptotic and necrotic cells after thermal stress was measured using flow cytometry. *P-value < 0.05, **P-value < 0.01. The error bars show the standard error of the mean based on biological replicates

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